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Ships within 48 hours · Estimated delivery Aug 2 - Aug 7
Cantilever & wafer tool kit for all Veeco SPMs: 1 scribe
Aspect ratio of 15:1 at 6um from tip apex
Cantilever Material: Silicon Nitride Cantilever Thickness (Nom): 3
This probe is also available without Aluminum reflex coating as model NCLV
SCMSAMPLE 48 N/m Cantilever & wafer tool kitScanning Capacitance Sample, on 15mm Puck DESCRIPTION CANTILEVER SPECIFICATIONS Scanning Capacitance Sample, on 15mm Puck. This sample shown domains when imaged in SCM mode. The sample is included with SCM application modules. Mounted on 15mm sample puck. For more information about this sample, view the Application Note. This sample shows domains when imaged in SCM mode. The sample is included with SCM application modules. Mounted on 15mm or 18mm
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